Scanning Microscopy for Nanotechnology: Techniques and Applications

£159.95

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Scanning Microscopy for Nanotechnology: Techniques and Applications Editors: Zhong Lin Wang, Weilie Zhou Format: Hardback First Published: Published By: Springer-Verlag New York Inc. Pages: 522 Illustrations and other contents: 399 Illustrations, black and white; XIV, 522 p. 399 illus. Language: English ISBN: 9780387333250 Categories: ,

This book presents scanning electron microscopy (SEM) fundamentals and applications for nanotechnology. It includes integrated fabrication techniques using the SEM, such as e-beam and FIB, and it covers in-situ nanomanipulation of materials. The book is written by international experts from the top nano-research groups that specialize in nanomaterials characterization. The book will appeal to nanomaterials researchers, and to SEM development specialists.

Weight1.087 kg

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