Progress in Transmission Electron Microscopy 2: Applications in Materials Science

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Progress in Transmission Electron Microscopy 2: Applications in Materials Science Editors: Xiao-Feng Zhang, Ze Zhang Format: Hardback First Published: Published By: Springer-Verlag Berlin and Heidelberg GmbH & Co. KG Pages: 307 Illustrations and other contents: 5 Tables, black and white; XIV, 307 p. Language: English ISBN: 9783540676812 Categories: ,

Transmission electron microscopy (TEM) is now recognized as a crucial tool in materials science. This book, authored by a team of expert Chinese and international authors, covers many aspects of modern electron microscopy, from the architecture of novel electron microscopes, advanced theories and techniques in TEM and sample preparation, to a variety of hands-on examples of TEM applications. Volume II illustrates the important role that TEM is playing in the development and characterization of advanced materials, including nanostructures, interfacial structures, defects, and macromolecular complexes.

Weight1.42 kg

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