Modeling Nanoscale Imaging in Electron Microscopy

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Modeling Nanoscale Imaging in Electron Microscopy Editors: Peter Binev, Wolfgang Dahmen, Thomas Vogt Format: Paperback / softback First Published: Published By: Springer-Verlag New York Inc. Pages: 182 Illustrations and other contents: 40 Tables, black and white; IX, 182 p. Language: English ISBN: 9781489997289 Categories: ,

Modeling Nanoscale Imaging in Electron Microscopy presents the recent advances that have been made using mathematical methods to resolve problems in microscopy. With improvements in hardware-based aberration software significantly expanding the nanoscale imaging capabilities of scanning transmission electron microscopes (STEM), these mathematical models can replace some labor intensive procedures used to operate and maintain STEMs. This book, the first in its field since 1998, will also cover such relevant concepts as superresolution techniques, special denoising methods, application of mathematical/statistical learning theory, and compressed sensing.

Weight0.302 kg

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From the reviews: "In six chapters, the editors tackle the ambitious challenge of bridging the gap between high-level applied mathematics and experimental electron microscopy. They have met the challenge admirably. ... That work is also applicable to the new generation of x-ray free-electron lasers, which have similar prospective applications, and illustrates nicely the importance of applied mathematics in the physical sciences. Modeling Nanoscale Imaging in Electron Microscopy will be an important resource for graduate students and researchers in the area of high-resolution electron microscopy." (Les J. Allen, Physics Today, Vol. 65 (5), May, 2012)

Author Biography

Thomas Vogt is Director of the NanoCenter Educational Foundation and Distinguished Professor of Chemistry & Biochemistry at the University of South Carolina. Wolfgang Dahmen is a professor at RWTH Aachen. Peter G. Binev is a Professor of Mathematics at the University of South Carolina.