Atomic Force Microscopy: Understanding Basic Modes and Advanced Applications

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Atomic Force Microscopy: Understanding Basic Modes and Advanced Applications Author: Format: Hardback First Published: Published By: John Wiley and Sons Ltd Pages: 488 Language: English ISBN: 9780470638828 Categories: ,

This book enlightens readers on the basic surface properties and distance-dependent intersurface forces one must understand to obtain even simple data from an atomic force microscope (AFM). The material becomes progressively more complex throughout the book, explaining details of calibration, physical origin of artifacts, and signal/noise limitations. Coverage spans imaging, materials property characterization, in-liquid interfacial analysis, tribology, and electromagnetic interactions. Supplementary material for this book can be found by entering ISBN 9780470638828 on booksupport.wiley.com

Weight0.818 kg

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Author Biography

GREG HAUGSTAD, PhD, is a technical staff member and Director of the Characterization Facility in the College of Science and Engineering at the University of Minnesota. He has collaborated with industry professionals on such technologies as medical X-ray imaging media, lubrication, inkjet printing, and more recently on biomedical device coatings. He teaches undergraduate and graduate AFM courses, as well as short professional courses, and has trained over 600 AFM users.