Acoustic Scanning Probe Microscopy

£129.95

usually dispatched within 6-10 days
Acoustic Scanning Probe Microscopy Editors: Francesco Marinello, Daniele Passeri, Enrico Savio Format: Hardback First Published: Published By: Springer-Verlag Berlin and Heidelberg GmbH & Co. KG Pages: 494 Illustrations and other contents: XXVI, 494 p. Language: English ISBN: 9783642274930 Categories: ,

The combination of atomic force microscopy with ultrasonic methods allows the nearfield detection of acoustic signals. The nondestructive characterization and nanoscale quantitative mapping of surface adhesion and stiffness or friction is possible. The aim of this book is to provide a comprehensive review of different scanning probe acoustic techniques, including AFAM, UAFM, SNFUH, UFM, SMM and torsional tapping modes. Basic theoretical explanations are given to understand not only the probe dynamics but also the dynamics of tip surface contacts. Calibration and enhancement are discussed to better define the performance of the techniques, which are also compared with other classical techniques such as nanoindentation or surface acoustic wave. Different application fields are described, including biological surfaces, polymers and thin films.

Weight0.9215525 kg

Reviews

There are no reviews yet.

Only logged in customers who have purchased this product may leave a review.