Aberration-corrected Analytical Electron Microscopy

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Aberration-corrected Analytical Electron Microscopy Editor: Rik Brydson Format: Other digital First Published: Published By: John Wiley & Sons Inc Pages: 296 Language: English ISBN: 9781119978848 Categories: ,

The book is concerned with the theory, background, and practical use of transmission electron microscopes with lens correctors that can correct the effects of spherical aberration. The book also covers a comparison with aberration correction in the TEM and applications of analytical aberration corrected STEM in materials science and biology. This book is essential for microscopists involved in nanoscale and materials microanalysis especially those using scanning transmission electron microscopy, and related analytical techniques such as electron diffraction x-ray spectrometry (EDXS) and electron energy loss spectroscopy (EELS).

Weight0.666 kg

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This book is essential for microscopists involved in nanoscale and materials microanalysis especially those using scanning transmission electron microscopy, and related analytical techniques such as electron diffraction x-ray spectrometry (EDXS) and electron energy loss spectroscopy (EELS). (Imaging & Microscopy, 1 March 2012)